STNewsline (sm) 5/2005
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European Edition
03 May 2005
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PIUG Annual Conference:
FREE workshop and STN Patent Forum (9, 10)
STN-Benutzertreffen in Frankfurt/Main, Muenchen und Essen (11)
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THIS ISSUE
FILE UPDATES
3. EMBASE - DATABASE RELOADED AND ENHANCED
4. EMBASE - DATABASE RELOADED AND ENHANCED
5. IPA - COPYRIGHT LINE CHANGED
6. PATDPASPC - ADDED TO DATABASE CLUSTERS
7. TOXCENTER - COPYRIGHT LINE FOR IPA RECORDS IN TOXCENTER CHANGED
8. WPIFV/WPIDS/WPINDEX/WPIX - INDIAN PATENT DATA AVAILABLE; MANUAL CODE REVISIONS PROJECT
FYI
9. FIZ KARLSRUHE AT THE 2005 PIUG ANNUAL CONFERENCE
10. STN PATENT FORUM AT THE 2005 PIUG ANNUAL CONFERENCE
11. STN-BENUTZERTREFFEN IN FRANKFURT/MAIN, MUENCHEN UND ESSEN
FILE UPDATES
1. BEILSTEIN UPDATED with more than 85,000 new compounds
With the update on April 21, 2005 more than 85,000 new compounds and supplementary recent data for about 50,000 compounds have been added to the BEILSTEIN database. Currently the file contains 9,218,366 organic compounds. For about 8,000,000 BEILSTEIN substances reaction data are available in the file.
The Database Summary Sheet is available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/beilstei.html
2. CA/CAPLUS - A CHANGE IN FILING DATE FOR U.S. PATENT APPLICATIONS AFFECTS HOW PATENT FAMILIES ARE BUILT; CURRENT AWARENESS ALERTS (SDIS) MAY BE AFFECTED
In early April, the U.S. Patent & Trademark Office (USPTO) made a change to the International Common Elements (ICE). The change means that the International Patent (PCT) application filing date has replaced the U.S. filing date on patent application and grant publications.
The patent families in the CA/CAplus family of databases and other patent databases, such as USPATFULL and USPAT2, have been built with the application number which contains the U.S. filing date.
Effective April 24, 2005, CAS staff implemented a solution for this change when building patent families. In order to continue to create a patent application number that uniquely identifies a U.S. patent, the U.S. filing year portion of the patent application number (/AP) field is approximated by a table lookup of the application series and sequence number combination. Consequently, in most cases, you should have no need to make changes to patent searching. This procedure has also been applied to USPATFULL/USPAT2.
If you are using a U.S. application number, the current-awareness alerts in your current awareness search, the alerts may be affected.
Since patent searching, especially current-awareness searching, in CA/CAplus and USPATFULL/USPAT may be affected, it is recommended that you follow these instructions. To ensure that the desired US patents are retrieved when searching US patent application numbers in the Patent Application Number (/AP) field, you should use the character masking symbol ! for the last digit of the year. For example, a search of US200!-204412/AP would match on US2000-204412, US2001-204412, US2002-204412, US2003-204412, US2004-204412, and US2005-204412.
The Database Summary Sheets are available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/ca.html
(CA)
http://www.stn-international.de/stndatabases/databases/caplus.html
(CAplus)
3. EMBASE - DATABASE RELOADED AND ENHANCED
EMBASE has been reloaded and enhanced. The enhancements include the addition of:
Sentence (S) proximity searching in the Abstract (/AB) field
Simultaneous left and right truncation to the Abstract (/AB) and Title (/TI) search fields, as well as the Basic Index (/BI)
The Entry Date (/ED or /UP) field to the BIB, IBIB, ALL, DALL, and IALL display formats. The following is an example of the Entry Date display field:
ED Entered STN: 20050310
Last Updated on STN: 20050310
A new URL search and display field, also displayed in the Source (/SO) field, which can be used as a link to the article's full text:
SO Dermatology Online Journal, (2004) Vol. 10, No. 2 Refs: 16
ISSN: 1087-2108
URL:
http://dermatology.cdlib.org/102/case_presentations/leishmaniasis2/aghaei.html
In addition, stop words are no longer utilized in the Basic Index (/BI).
The 2005 EMTREE thesaurus has also been implemented within EMBASE.
The Database Summary Sheet is available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/embase.html
4. IPA - COPYRIGHT LINE CHANGED
The copyright line for International Pharmaceutical Abstracts (IPA) now reads
© 2005 The Thomson Corporation.
The Database Summary Sheet is available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/ipa.html
5. PATDPASPC - ADDED TO DATABASE CLUSTERS
PATDPASPC has been added to the ALLBIB, CASRNS, HPATENTS, and PATENTS database clusters.
A complete listing of database clusters is available at:
http://www.stn-international.de/stndatabases/clusters/clusters.html
The Database Summary Sheet is available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/patdpaspc.html
6. TOXCENTER - COPYRIGHT LINE FOR IPA RECORDS IN TOXCENTER CHANGED
The copyright line for IPA records in TOXCENTER now reads
© 2005 The Thomson Corporation.
The Database Summary Sheet is available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/toxcenter.html
7. USPATFULL/USPAT2 - A CHANGE IN FILING DATE FOR U.S. PATENT APPLICATIONS AFFECTS HOW PATENT FAMILIES ARE BUILT; CURRENT AWARENESS ALERTS (SDIS) MAY BE AFFECTED
In early April, the U.S. Patent & Trademark Office (USPTO) made a change to the International Common Elements (ICE). The change means that the International Patent (PCT) application filing date has replaced the U.S. filing date on patent application and grant publications.
The patent families in USPATFULL and USPAT2, as well as the CA/CAplus family of databases, have been built with the application number which contains the U.S. filing date.
Effective April 24, 2005, CAS staff implemented a solution for this change when building patent families. In order to continue to create a patent application number that uniquely identifies a U.S. patent, the U.S. filing year portion of the patent application number (/AP) field is approximated by a table lookup of the application series and sequence number combination. Consequently, in most cases, you should have no need to make changes to patent searching. This procedure was also applied to the CA/CAplus family of databases.
If you are using a U.S. application number in your current awareness search, the alerts may be affected.
Since patent searching, especially current-awareness searching, in CA/CAplus and USPATFULL/USPAT may be affected, it is recommended that you follow these instructions. To ensure that the desired US patents are retrieved when searching US patent application numbers in the Patent Application Number (/AP) field, you should use the character masking symbol ! for the last digit of the year. For example, a search of US200!-204412/AP would match on US2000-204412, US2001-204412, US2002-204412, US2003-204412, US2004-204412, and US2005-204412.
The Database Summary Sheets are available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/uspatful.html
http://www.stn-international.de/stndatabases/databases/uspat2.html
8. WPIFV/WPIDS/WPINDEX/WPIX - INDIAN PATENT DATA AVAILABLE; MANUAL CODE REVISIONS PROJECT
You will soon be able to search Indian patent documents in Derwent WPI First View SM (from the end of April) and in Derwent World Patents Index® (from the end of May). For more information visit
http://scientific.thomson.com/newsletter/2005-04/8272726/
Derwent World Patents Index Manual Code Revision Project As part of the ongoing development of Derwent WPI®, Thomson Scientific would like you to submit suggestions for possible inclusion in their 2006 EPI and CPI Manual Code revision. The deadline for your suggestions is 30 June. For more information visit http://tinyurl.com/42r8m
The Database Summary Sheets are available in STNGUIDE and at:
http://www.stn-international.de/stndatabases/databases/wpifv.html
(WPIFV)
http://www.stn-international.de/stndatabases/databases/wpidswpx.html(WPIDS/WPIX)
http://www.stn-international.de/stndatabases/databases/wpi.html
(WPINDEX)
FYI
9. FIZ KARLSRUHE AT THE 2005 PIUG ANNUAL CONFERENCE
Meet FIZ Karlsruhe at the 2005 PIUG Annual Conference May 21-26, 2005, Hyatt Regency Crystal City, Arlington, VA.
FIZ Karlsruhe is again proud to be a sponsor of the Patent Information Users Group (PIUG) Annual Conference. Come and meet us at our exhibition stand during the meeting and learn the latest STN patent file news, including all about new full-text databases from Europe (EPFULL) and the United Kingdom (GBFULL), and recent enhancements to patent family SDIs in INPADOC.
To learn more and to register for the Conference visit:
http://www.piug.org/2005/an05meet.html
You are invited to attend a FREE workshop "Structure searching Derwent WPI using STN Express", presented by FIZ Karlsruhe at the 2005 PIUG Annual Conference on Sunday May 22nd, 1.00-3.00 PM, 2005. The workshop will provide an informative review of chemical structure searching in Derwent World Patents Index on STN for experts and those new to STN. To learn more and to REGISTER visit:
http://www.stn-international.com/training_center/workshops/sdwpi_ws.html
10. STN PATENT FORUM AT THE 2005 PIUG ANNUAL CONFERENCE
You are invited to attend the STN Patent Forum at the 2005 PIUG Annual Conference on Thursday May 26th, 9.00 AM - 4.00 PM Hyatt Regency Crystal City, Arlington, VA.
STN Headlines - discover what's new in the patent databases on STN New Approaches for Analysis of STN Data - Sneak Preview of upcoming STN software enhancements!
Using STN to Find Promising New Areas for Research - using stem cell research
as a case study topic Performing Effective Freedom to Operate Searches - how
to conduct a comprehensive FTO search on STN To learn more visit:
http://www.cas.org/support/stngen/stntraining/workshops.html
To register visit:
http://www.cas.org/forms/regform.html
11. STN-BENUTZERTREFFEN IN FRANKFURT/MAIN, MUENCHEN UND ESSEN
Am 14. Juni 2005 findet in Frankfurt/Main ein STN-Benutzertreffen statt, zu dem wir Sie herzlich einladen.
Veranstaltungsort: Dechema, Theodor-Heuss-Allee 25, Frankfurt/Main
Dauer: 13.30 - 17.15 Uhr
Die Teilnahme ist kostenlos! Wir bitten um Anmeldung bis 03.06.2005.
Das ausfuehrliche Programm und ein Anmeldeformular finden Sie unter
http://www.stn-international.de/training_center/workshop_material/ag_ffm.pdf
Weitere STN-Benutzertreffen finden am 20.06.2005 in Muenchen und am 23.06.2005 in Essen statt.
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