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provided by FIZ Karlsruhe

New on STN

November 2015

Derwent Markush Resource now available on the new STN platform!

September 2015

New Version of Emtree Introduces over 800 New Terms to Embase on Classic STN and New STN

August 2015

DWPI: Manual Code Revision 2016 – Submit your Suggestions

STN User Meetings

Madrid, 24.11.2015
Barcelona, 25.11.2015
Erfurt, 01.12.2015


STN AnaVist - Analysis and visualization software for information professionals

STN AnaVist is a powerful interactive analysis and visualization software that offers a variety of ways to analyze search results from scientific literature and patents, as well as visualize patterns and trends in the research.

Product Overview

STN AnaVist can help you answer complex questions as well as provide information that can be used to make faster and better business decisions.

With STN AnaVist

  • Analyze the patent landscape - determine who, what, where, when, and why
  • Track competitive intelligence - find out what your competitors are doing
  • Discover new applications for existing technology
  • Determine research trends - find whether a particular area of research is on the rise, steady, or declining
  • Support strategic business planning

Features and Benefits

STN AnaVist offers a unique combination of features and capabilities for efficiently analyzing and interpreting information retrieved from scientific and patent databases on STN.

Key features include:

  • Answer set creation with STN Express - Easily import answer sets created in STN Express, Version 8.4 or higher.
  • Integrated content from multiple databases - Analyze and visualize data from multiple sources, including CAplusSM, Derwent World Patents Index (DWPI), PCT, and U.S. full-text patent databases.
    Learn more about Exploring DWPI in STN AnaVist, Version 2.0PDF(revised, 06/2008)
  • Concept standardization - Application of CAS vocabulary standardizes technology terms across the databases, reducing data scatter, saving time, and providing more meaningful results.
  • Visualization workspace - View interactive relationships among data and charts in the visualization workspace. Easily see relationships by highlighting data during the analysis.
  • Customized analysis and visualization - Choose from a variety of new or enhanced analysis and visualization features.

STN AnaVist is the only platform that permits analysis of both CAplus and DWPI, with content processed by STN International for optimal visualization.

Key capabilities include:

  • Group and cleanup data - A company name thesaurus appropriately groups companies and company name variations prior to the analysis. Group and edit company and researcher names and keep the custom groupings for future use.
  • View unique relationships between structured and unstructured data - uncover relationships among 13 different fields within documents, e.g., companies, inventors, years, and concepts extracted from text.
  • Produce instant, understandable results and create reports - Gain insight into the topic of interest immediately upon completion of the visualization. Two types of pre-defined project reports are available and include the 1-page Summary Reports and multiple-page Detailed Reports.
  • Share visualization results - Share visualization results with others within an organization and create multiple versions of visualization projects. STN Login IDs for Shared Projects are available for those who wish to view and customize STN AnaVist visualization projects prepared by others.
  • Process results : You can export/download CAplus documents from STN AnaVist for use in third party A&V tools, as permitted in the CAS Information Use Policies.

If you have an STN login ID and password, download STN AnaVist and STN Express software for free via the STN Software Download web site. To request the software on CD-ROM, contact STN Help Desk or use our order form for STN AnaVist and STN Express. If you are currently using STN Express, Version 8.4, install the discover.fil update when prompted to use all of the new features in STN AnaVist.