CAS STNext e-Seminar: Searching for Japanese patent information on CAS STNext^®

Many databases on the CAS STNext® platform have Japanese patent information. This e-seminar will identify those databases and the specific Japanese patent coverage within those databases. The session will also cover the differences in patent number formats over time, the various kind codes used by the Japanese patent office, and the two Japanese classification systems (FCL and FTERM.) Links to the Japanese national register will additionally be discussed. This e-seminar is geared to searchers of all levels.

Presentation